发明名称 METHOD FOR FABRICATING CAPACITOR PREVENTED LEANING
摘要 A method of manufacturing a capacitor for preventing a leaning effect is provided to form a supporting layer having a symmetrical structure by removing surface roughness due to a stepped part generated in a storage node electrode manufacturing process. A first supporting layer(23) is formed on an insulating layer(21) including a storage node contact electrode(22). A second supporting layer(24A) as an etch-stop layer is formed on the first insulating layer. The second supporting layer is planarized. A third supporting layer is formed on the second supporting layer. An open region for opening a surface of the storage node contact electrode is formed by etching the third supporting layer, the second supporting layer, and the first supporting layer. A storage node(27) is formed within the opening region. The third supporting layer is removed selectively.
申请公布号 KR20080060304(A) 申请公布日期 2008.07.02
申请号 KR20060134250 申请日期 2006.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SANG OH
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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