发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH LANDING PLUG CONTACT
摘要 A manufacturing method of a semiconductor device having a landing plug contact is provided to prevent SAC(Self Aligned Contact) fail and not-open of a contact hole by leaving lots of remaining nitride layers. A manufacturing method of a semiconductor device includes the processes of: forming plural line patterns; forming an interlayer dielectric(24) for gap-filling the line patterns; etching the interlayer dielectric in the SAC method; forming a buffer layer(28B) on the entire structure, after etching the interlayer dielectric; forming an etch barrier layer(29A) on the buffer layer; and exposing a gap of line patterns by etching the etch barrier layer and the buffer layer at the same time.
申请公布号 KR20080060367(A) 申请公布日期 2008.07.02
申请号 KR20060134338 申请日期 2006.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JAE YOUNG;LEE, MIN SUK
分类号 H01L21/28 主分类号 H01L21/28
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