发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH LANDING PLUG CONTACT |
摘要 |
A manufacturing method of a semiconductor device having a landing plug contact is provided to prevent SAC(Self Aligned Contact) fail and not-open of a contact hole by leaving lots of remaining nitride layers. A manufacturing method of a semiconductor device includes the processes of: forming plural line patterns; forming an interlayer dielectric(24) for gap-filling the line patterns; etching the interlayer dielectric in the SAC method; forming a buffer layer(28B) on the entire structure, after etching the interlayer dielectric; forming an etch barrier layer(29A) on the buffer layer; and exposing a gap of line patterns by etching the etch barrier layer and the buffer layer at the same time.
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申请公布号 |
KR20080060367(A) |
申请公布日期 |
2008.07.02 |
申请号 |
KR20060134338 |
申请日期 |
2006.12.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JAE YOUNG;LEE, MIN SUK |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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