SEMICONDUCTOR DEVICE, DATA WRITING METHOD OF SEMICONDUCTOR DEVICE, AND DATA READING METHOD OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To prevent a deterioration of each element in a semiconductor device which writes data by giving a high load to the memory elements to cause a chemical reaction, by lightening a load imposed on circuit elements and memory elements, which is caused by applying a load.

SOLUTION: Such a control is made in a memory section 103 that the data same as the input data are written as memory data when the memory data of an address just before are in a first load condition, and the input data are reversed and written as the memory data when the memory data of the address just before are in a second load condition applying a voltage higher than that of the first load condition.

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