发明名称 CHEMICAL MECHANICAL POLISHING METHOD AND FABRICATION METHOD OF SEMICONDUCTOR DEVICE USING THE SAME
摘要 A chemical mechanical polishing method and a method of fabricating a semiconductor device using the same are provided to reduce surface energy of an activation solution by adding a surface active agent. A CMP(Chemical Mechanical Polishing) device including a polishing pad and a polishing head is provided(S1). A polishing target loading process is performed to load a polishing target into a polishing head(S2). A polishing activation solution supply process is performed to supply a polishing activation solution including a surface active agent on a polishing pad(S3). A compressing process is performed to compress the polishing target by using a polishing pad(S4). The polishing target and the polishing pad are rotated relatively to each other.
申请公布号 KR20080058860(A) 申请公布日期 2008.06.26
申请号 KR20060133028 申请日期 2006.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, IL YOUNG;CHOO, JAE OUK;JUNG, NAM JIN;KIM, DONG HUN;LEE, HAN WOO;KIM, GYU NAM
分类号 H01L21/304 主分类号 H01L21/304
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