| 摘要 |
The invention relates to a test generation method for a system such as an integrated device and/or a computer program, comprising the following steps of generating a test set or sequence, applying the generated test set or sequence to the system, characterized in that it comprises setting triggers on given events and according given rules and/or criteria to each trigger, associating a designated action to each events, applying the designated actions if the criteria and/or rules corresponding to associate events are met. The Method further comprises computing additional information required by the designated actions. Additional information is computed on the basis of signal and/or behavior and/or data of the system under test. Moreover, given events and/or additional information are observed in the system under test environment or are predicted or extrapolated by any computational process. The invention also relates to a system and machine readable instructions, embodied in a tangible medium.
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