发明名称 Method and composition for polishing a substrate
摘要 Polishing compositions and methods for removing conductive materials and barrier materials from a substrate surface are provided. Polishing compositions are provided for removing at least a barrier material from a substrate surface by a chemical mechanical polishing process or by an electrochemical mechanical polishing process. The polishing compositions used in barrier removal may further be used after a process for electrochemical mechanical planarization process of a conductive material. The polishing compositions and methods described herein improve the effective removal rate of materials from the substrate surface with a reduction in planarization type defects.
申请公布号 US7390744(B2) 申请公布日期 2008.06.24
申请号 US20050130032 申请日期 2005.05.16
申请人 APPLIED MATERIALS, INC. 发明人 JIA RENHE;LIU FENG Q.;TSAI STAN D.;CHEN LIANG-YUH
分类号 H01L21/302;B23H5/08;C09G1/02;C09K13/00;C11D3/14;C11D3/39;C11D11/00;C25F3/02;C25F3/08;H01L21/321;H01L21/44;H01L21/4763;H01L21/768 主分类号 H01L21/302
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