| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of easily changing the speed of a pattern to be applied to a DUT by an inexpensive configuration without using on-the-fly timing control. SOLUTION: The semiconductor testing device can vary the speed of the pattern to be applied to the DUT, and is provided with a selection means for selecting either pattern data output from a data memory or an output signal fed back just before. COPYRIGHT: (C)2008,JPO&INPIT
|
