发明名称 |
HIGH-STABILITY THIN-FILM CAPACITOR AND METHOD FOR MAKING THE SAME |
摘要 |
According to the invention, the dielectric (6) of a capacitor (1) is made by superimposing at least two thin layers (6a, 6b) made of the same metallic oxide respectively in crystalline and amorphous forms and respectively having relative capacity quadratic ratios according to the opposed-signs voltage. The respective thickness d<SUB>a</SUB> and d<SUB>c</SUB> of the amorphous (6b) and crystalline (6a) thin layers correspond to the following general formulae in which: e<SUB>0</SUB> is the vacuum permittivity, e<SUB>c</SUB> and e<SUB>a</SUB> correspond to the relative permittivity of the metallic oxide respectively in the crystalline and amorphous forms, C<SUB>s0</SUB> is the zero-field total surface capacity, and ?<SUB>c</SUB> et ?<SUB>a</SUB> correspond to the relative capacity quadratic ratios according to the electric field of the metallic oxide respectively in the crystalline form and in the amorphous form. |
申请公布号 |
WO2008047000(A3) |
申请公布日期 |
2008.06.19 |
申请号 |
WO2007FR01701 |
申请日期 |
2007.10.16 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE;STMICROELECTRONICS (CROLLES 2) SAS;DEFAY, EMMANUEL;GUILLAN, JULIE;BLONKOWSKI, SERGE |
发明人 |
DEFAY, EMMANUEL;GUILLAN, JULIE;BLONKOWSKI, SERGE |
分类号 |
H01G4/10;H01G4/06;H01G4/33 |
主分类号 |
H01G4/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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