发明名称 SEMICONDUCTOR DEVICE HAVING A POLYSILICON ELECTRODE
摘要 A method of manufacturing a semiconductor device such as a MOS transistor. The device comprises a polysilicon gate (10) and doped regions (22,24) formed in a semiconductor substrate (12), separated by a channel region (26). The exposed surface of the semiconductor substrate is amorphized, by ion bombardment for example, so as to inhibit subsequent diffusion of the dopant ions during thermal annealing. Low thermal budgets are favoured for the activation and polysilicon regrowth to ensure an abrupt doping profile for the source/drain regions. As a consequence an upper portion (10b) of the gate electrode remains amorphous. The upper portion of the gate electrode is removed so as to allow a low resistance contact to be made with the polysilicon lower portion (10a).
申请公布号 WO2006134553(A3) 申请公布日期 2008.06.19
申请号 WO2006IB51879 申请日期 2006.06.13
申请人 NXP B.V.;PAWLAK, BARTLOMIEJ, J. 发明人 PAWLAK, BARTLOMIEJ, J.
分类号 H01L21/28;H01L21/324;H01L21/336;H01L29/49 主分类号 H01L21/28
代理机构 代理人
主权项
地址