| 摘要 |
The object of the present invention is to suppress a high impedance state of scan lines in a case where the scan lines are driven by using a demultiplexer. A logic AND circuit 34 outputs signals resulting from logical product of block selection signals Y- 1 , Y- 2 , and Y- 3 , . . . , and Y- 80 and a signal Enb as address signals Ad- 1 , Ad- 2 , and Ad- 3 , . . . , and Ad- 80 . A demultiplexer 40 distributes address signals Ad- 1 , Ad- 2 , Ad- 3 , . . . , and Ad- 80 to scan lines 112 in accordance with selection signals Sel- 1 , Sel- 2 , and Sel- 3 . Drains of TFTs 140 are connected to the scan lines 112 . The TFTs 140 are controlled to be turned on/off, for example, by using a signal Sel-all that is a logically inverted signal of the signal Enb, and when the TFTs are turned on, level L is determined.
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