发明名称 RESISTIVE MEMORY ELEMENT CONTAINING DOPANT, AND METHOD FOR MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a resistive memory element containing a dopant, and to provide a method for manufacturing the same. <P>SOLUTION: The resistive memory element containing the dopant has a lower electrode, a resistive layer containing the dopant formed on the lower electrode, and an upper electrode formed on the resistive layer. The lower electrode or the upper electrode is formed of a metal or a metal oxide. The metal contains at least one substance from among Al, Hf, Zr, Zn, W, Co, Au, Pt, Ru, Ir or Ti. Accordingly, this makes it possible to obtain the memory element which is high in reliability, wherein the voltage and resistive characteristics are stabilized. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008135752(A) 申请公布日期 2008.06.12
申请号 JP20070306382 申请日期 2007.11.27
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SEO SUN-AE;PARK YOUNG-SOO;JUNG RAN-JU;LEE MYOUNG-JAE;KIM DONG-CHUL;AHN SEUNG-EON
分类号 H01L27/10;H01L45/00;H01L49/00 主分类号 H01L27/10
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