| 摘要 |
PROBLEM TO BE SOLVED: To provide a conversion box of a semiconductor tester, which has a drop prevention function. SOLUTION: This conversion box loaded and fixed on a test head is characterized by being equipped with: a fitting block provided with one surface in contact with one surface of the conversion box; a lock hole provided in the fitting block, into which a lock pin of the test head is inserted at the locking time; and a detection sensor provided on the fitting block, for detecting whether the lock pin is inserted into the lock hole at the locking time. COPYRIGHT: (C)2008,JPO&INPIT
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