发明名称 A LAYOUT METHOD FOR MASK AND A SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A layout method for a mask and a semiconductor device and a method for manufacturing the same are provided to improve pattern uniformity between a main pattern region and a dummy pattern region by inserting a micro-lens dummy pattern. A micro-lens main pattern is formed on a substrate. A micro-lens dummy pattern(102) is formed on one side of the micro-lens main pattern. A color filter dummy pattern(101) is formed at a lower side of the micro-lens dummy pattern. The micro-lens dummy pattern is an octagon shape. A layout method for a mask includes a process for forming the micro-lens main pattern on the substrate and a process for forming the micro-lens dummy pattern on one side of the micro-lens main pattern.</p>
申请公布号 KR100837566(B1) 申请公布日期 2008.06.11
申请号 KR20070045624 申请日期 2007.05.10
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 LEE, SANG HEE;CHO, GAB HWAN
分类号 H01L21/027;H01L27/14 主分类号 H01L21/027
代理机构 代理人
主权项
地址
您可能感兴趣的专利