发明名称 SEMICONDUCTOR DEVICES INCLUDING A GETTING REGION AND METHODS OF FORMING THE SAME
摘要 <p>A semiconductor device having a gettering region and a manufacturing method thereof are provided to improve integration density of the semiconductor device by minimizing a metal contamination of an IC formed on a semiconductor layer. A semiconductor device includes a semiconductor substrate(100), an insulation layer(150), a device semiconductor layer(200), and at least one gettering region(165). The insulation layer is arranged on the semiconductor substrate. The device semiconductor layer is arranged on the insulation layer. The gettering region includes plural sites for capturing metal elements in the device semiconductor layer. The gettering region is arranged in the insulation layer. The gettering region is arranged in a charge semiconductor pattern inside the insulation layer. The charge semiconductor pattern is contacted with a lower surface of the device semiconductor layer.</p>
申请公布号 KR100837280(B1) 申请公布日期 2008.06.11
申请号 KR20070024094 申请日期 2007.03.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOUNG SOO;KIM, YOUNG NAM;LIM, YOUNG SAM;KIM, GI JUNG;KANG, PIL KYU
分类号 H01L21/00 主分类号 H01L21/00
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