| 摘要 |
On chip diagnosis method and on chip diagnosis block with mixed redundancy (IO redundancy and word-register redundancy) is provided. During a BIST (Built-In Self Test), information needed to apply redundancy resources is stored inside two arrays (fill_array, shift_array) on chip. A final diagnosis may apply redundancy resources based on this stored information. The first array (fill_array) is used to keep a minimum error mapping and the second array (shift_array) is used to control the fill of the first array.
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