发明名称 |
MAGNETOELECTRIC SUSCEPTIBILITY MEASUREMENT SYSTEM |
摘要 |
A magnetoelectric susceptibility measurement system is provided to widen an application range by measuring a magnetoelectric effect of magnetoelectric materials in low and high frequency bands. A magnetoelectric susceptibility measurement system is composed of a magnet(120) for applying a DC(Direct Current) magnetic field(Hbias) to a magnetoelectric sample(110), an AC(Alternating Current) induction coil for applying an AC magnetic field(deltaH) to the magnetoelectric sample, a charge amplifier for applying a charge signal of the magnetoelectric sample vibrated by the AC magnetic field, and a phase sensitive detector for detecting a charge signal amplified in the charge amplifier while supplying induction current to the AC induction coil. The electromagnet or superconductive magnet is used. The charge amplifier has a resistor, a condenser, and an operational amplifier connected in parallel.
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申请公布号 |
KR100834846(B1) |
申请公布日期 |
2008.06.09 |
申请号 |
KR20060123845 |
申请日期 |
2006.12.07 |
申请人 |
SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, KEE HOON;OH, YOON SEOK |
分类号 |
G01R33/035 |
主分类号 |
G01R33/035 |
代理机构 |
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