发明名称 |
OPTOELECTRONIC MEASURING SYSTEM FOR ACQUIRING POSITION AND ORIENTATION MEASURES IN AN INDUSTRIAL MACHINE |
摘要 |
<p>Optoelectronic position and orientation measurement system (S2, R2, S3, R3) to determine the position of a working tool, movable in two or three dimensions, in an industrial machine. A sequence of two or optionally three consecutive laser beams (B2, B3) is guided along the two or three axes (A_Z, A_X) of movement of the machine. The full position of each of the two or three end points of the optical measuring systems (e.g. interferometers) , fixed to mobile parts (4, 9) of the machine, are measured to determine all six degrees of freedom of the working tool with respect to the stationary frame of the machine . Endpoints of one interferometer preferably coincide with the starting points of the next interferometer such that no unmeasured parts may introduce errors .</p> |
申请公布号 |
WO2008065683(A1) |
申请公布日期 |
2008.06.05 |
申请号 |
WO2006IT00820 |
申请日期 |
2006.11.27 |
申请人 |
SINTESI S.C.P.A.;FLORIO, COSTANTINO;MARTANA, ROBERTO;VESCIO, BASILIO;GUADAGNO, GIANLUCA;NEGRI, GIANPIERO |
发明人 |
FLORIO, COSTANTINO;MARTANA, ROBERTO;VESCIO, BASILIO;GUADAGNO, GIANLUCA;NEGRI, GIANPIERO |
分类号 |
B23Q15/18;B23Q17/24;G01B11/00;G05B19/23 |
主分类号 |
B23Q15/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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