发明名称 |
Apparatus For Depth-Selective Raman Spectroscopy |
摘要 |
Apparatus and methods for detecting Raman spectral features non destructively from sub-surface regions of a diffusely scattering sample are disclosed. Incident radiation is supplied at one or more sample surface entry regions, and light is collected from one or more collection regions spaced from the entry regions. Raman features are detected in the collected light, and depth information is derived according to the entry-collection spacings.
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申请公布号 |
US2008129992(A1) |
申请公布日期 |
2008.06.05 |
申请号 |
US20050792684 |
申请日期 |
2005.11.25 |
申请人 |
THE SCIENCE AND TECHNOLOGY FACILITIES COUNCIL |
发明人 |
MATOUSEK PAVEL;PARKER ANTHONY WILLIAM |
分类号 |
G01J3/44;A61B5/00;A61B5/103;G01N21/65 |
主分类号 |
G01J3/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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