发明名称 Apparatus For Depth-Selective Raman Spectroscopy
摘要 Apparatus and methods for detecting Raman spectral features non destructively from sub-surface regions of a diffusely scattering sample are disclosed. Incident radiation is supplied at one or more sample surface entry regions, and light is collected from one or more collection regions spaced from the entry regions. Raman features are detected in the collected light, and depth information is derived according to the entry-collection spacings.
申请公布号 US2008129992(A1) 申请公布日期 2008.06.05
申请号 US20050792684 申请日期 2005.11.25
申请人 THE SCIENCE AND TECHNOLOGY FACILITIES COUNCIL 发明人 MATOUSEK PAVEL;PARKER ANTHONY WILLIAM
分类号 G01J3/44;A61B5/00;A61B5/103;G01N21/65 主分类号 G01J3/44
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