发明名称 DEBUG INFORMATION COLLECTING METHOD AND DEBUG INFORMATION COLLECTING SYSTEM
摘要 A debug information collecting method and a debug information collecting system are provided to reduce the amount of information to be collected, to avoid an increase in execution time caused by the information collection and to estimate a cause of a failure by statistically analyzing the whole collected information. The debug information collecting system includes a software distribution unit(102). The software distribution unit includes a binary code analysis unit(122), a binary-code change unit(125) and a software distribution unit(129). The binary code analysis unit determines a total set of insertion positions at which probes can be inserted into software. The binary code change unit determines the population of insertion positions of probes to be inserted into the software and the number of insertion positions of probes to be inserted on a device basis. Then, the binary code change unit selects, from the population, insertion positions of probes as many as the determined number of insertion positions and inserts the probes into the software at the selected insertion positions. The software distribution unit distributes, to the device, the software into which the probes are inserted. As a result, it is possible to reduce both a load on the device side and a load on the software developer side at the same time and to acquire uniform debug information without deviations.
申请公布号 KR20080050331(A) 申请公布日期 2008.06.05
申请号 KR20070122825 申请日期 2007.11.29
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) 发明人 KAWASAKI SHINICHIRO;NOJIRI TOORU
分类号 G06F11/28;G06F11/30 主分类号 G06F11/28
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