发明名称 METHOD FOR REDIRECTING VOID DIFFUSION AWAY FROM VIAS IN AN INTEGRATED CIRCUIT DESIGN
摘要 A method for redirecting void diffusion away from vias in an integrated circuit design includes steps of forming an electrical conductor in a first electrically conductive layer of an integrated circuit design, forming a via between a distal end of the electrical conductor and a second electrically conductive layer of the integrated circuit design, and reducing tensile stress in the electrical conductor to divert void diffusion away from the via.
申请公布号 US2008132065(A1) 申请公布日期 2008.06.05
申请号 US20080018849 申请日期 2008.01.24
申请人 ALLMAN DERRYL D J;BHATT HEMANSHU D;MAY CHARLES E;BURKE PETER AUSTIN;KWAK BYUNG-SUNG;SUN SEY-SHING;PRICE DAVID T;PRITCHARD DAVID 发明人 ALLMAN DERRYL D. J.;BHATT HEMANSHU D.;MAY CHARLES E.;BURKE PETER AUSTIN;KWAK BYUNG-SUNG;SUN SEY-SHING;PRICE DAVID T.;PRITCHARD DAVID
分类号 H01L21/44 主分类号 H01L21/44
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