发明名称 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects
摘要 Disclosed is a case where an aligning method according to the present invention is applied to a probe apparatus. Target probes are photographed by an upper CCD camera and target electrode pads are photographed by a lower CCD camera. Second virtual images of the photographed probes and first virtual images of the electrode pads are displayed in second and first image data areas on a monitor screen. Dark and light colors in terms of brightness are applied to pixels of the second virtual image and the first virtual image. The second virtual images are moved on the monitor screen, so that the second virtual images are superimposed on the first virtual images. The total sum of the brightness (luminance) of all the first virtual images is calculated. On the basis of the calculated luminance value, a position where the target probes are most successfully brought into contact with the target pads is detected.
申请公布号 US7382914(B2) 申请公布日期 2008.06.03
申请号 US20050151534 申请日期 2005.06.14
申请人 TOKYO ELECTRON LIMITED 发明人 OBI HIROKI
分类号 G01R1/073;G06K9/00;G01R31/28;G03F9/00;G06T1/00;H01L21/66;H04N7/18 主分类号 G01R1/073
代理机构 代理人
主权项
地址