发明名称 MATTER ANALYSIS APPARATUS AND METHOD FOR ANALYZING MATTER
摘要 An apparatus for analyzing materials is provided to measure a plurality of samples only by exchanging a relatively cheap sample reaction portion with re-using a detection portion, thereby reducing economical burden on a user. An apparatus for analyzing materials comprises: a sample reaction portion(100) where a fixation material(B) reacting with a sample is attached; a light source(110) which applies light to the reacted sample to allow the reacted sample to be thermally expanded; and a detection portion(130) which detects pressure wave generated by the thermal expansion of the sample. The apparatus further comprises a controlling portion analyzing the sample based on information regarding the detected pressure wave. A method for analyzing materials comprises the steps of: (a) thermally expanding a sample reacted with a fixation material; (b) measuring pressure wave generated from the thermally expanded sample; and (c) analyzing the reacted sample based on the measured thermally expanded sample. Further, the pressure wave is transmitted to the detection portion through a transmission medium which is a buffer solution.
申请公布号 KR20080048867(A) 申请公布日期 2008.06.03
申请号 KR20060119358 申请日期 2006.11.29
申请人 LG ELECTRONICS INC. 发明人 YUN, KYU SIK;LIM, GUEI SAM;HYUN, SEOK JUNG
分类号 G01N33/53;C12Q1/54 主分类号 G01N33/53
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