发明名称 |
MATTER ANALYSIS APPARATUS AND METHOD FOR ANALYZING MATTER |
摘要 |
An apparatus for analyzing materials is provided to measure a plurality of samples only by exchanging a relatively cheap sample reaction portion with re-using a detection portion, thereby reducing economical burden on a user. An apparatus for analyzing materials comprises: a sample reaction portion(100) where a fixation material(B) reacting with a sample is attached; a light source(110) which applies light to the reacted sample to allow the reacted sample to be thermally expanded; and a detection portion(130) which detects pressure wave generated by the thermal expansion of the sample. The apparatus further comprises a controlling portion analyzing the sample based on information regarding the detected pressure wave. A method for analyzing materials comprises the steps of: (a) thermally expanding a sample reacted with a fixation material; (b) measuring pressure wave generated from the thermally expanded sample; and (c) analyzing the reacted sample based on the measured thermally expanded sample. Further, the pressure wave is transmitted to the detection portion through a transmission medium which is a buffer solution.
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申请公布号 |
KR20080048867(A) |
申请公布日期 |
2008.06.03 |
申请号 |
KR20060119358 |
申请日期 |
2006.11.29 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
YUN, KYU SIK;LIM, GUEI SAM;HYUN, SEOK JUNG |
分类号 |
G01N33/53;C12Q1/54 |
主分类号 |
G01N33/53 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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