| 摘要 |
An insert for a test handler is provided to exchange a latch block simply and to recycle the latch block regardless of the size of a semiconductor device by detachably joining a latch block to an insert body. In an insert(400) for a test handler, an insert body(410) has a placing space(411) for settling a semiconductor device. At least one latch block(420) is detachably combined to the insert body to hold the placed state of the semiconductor device settled in the placing space. The insert body has a block receiving groove(412) for containing the latch block. The latch block is fitted in the block receiving groove. A hanging sill is formed on the inner wall of the block receiving groove in the insert body. A hanging pin projection(421a) to move elastically is hung to the hanging sill to prevent separation of the latch block, when the latch block is contained in the block receiving groove. |
