发明名称 Electrical Insulating Layer for Metallic Thermal Interface Material
摘要 Various semiconductor devices and method of manufacturing the same are provided. In one aspect, a method of manufacturing is provided that includes forming an insulating layer on a backside of a semiconductor chip and forming a metallic thermal interface material on the insulating layer. In another aspect, an integrated circuit is provided that includes a semiconductor chip that has a front side and a backside. An insulating layer is on the backside and a metallic thermal interface material is on the insulating layer.
申请公布号 US2008124840(A1) 申请公布日期 2008.05.29
申请号 US20060461305 申请日期 2006.07.31
申请人 SU MICHAEL Z 发明人 SU MICHAEL Z.
分类号 H01L21/62 主分类号 H01L21/62
代理机构 代理人
主权项
地址