| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To realize a semiconductor device which easily tests the operation margin of an internal voltage generation circuit. <P>SOLUTION: The semiconductor device comprises: a VINT generation circuit 11 generating a constant voltage inside a chip; and a test circuit 12 connecting power supply wiring VDD supplying potential from the outside to wiring VINT supplying potential from the VINT generation circuit 11 via a prescribed value of resistance, based on control input in a test mode. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
