发明名称 State maintenance pulsing for a memory device
摘要 State maintenance of a memory cell and, more particularly, state maintenance pulsing of identified memory cells more frequently than other memory cells, is described. A memory array includes an array of memory cells. State maintenance circuitry is coupled to the array of memory cells. The state maintenance circuitry is configured to select between a first restore address and a second restore address. In a given operation cycle, the first restore address is associated with a first line in the array of memory cells, and the second restore address is associated with a second line in the array of memory cells. The first line has first memory cells coupled thereto. The second line has second memory cells coupled thereto. The first memory cells are capable of passing a threshold retention time with a first frequency of restore cycling. The second memory cells are capable of passing the threshold retention time with a second frequency of restore cycling. The second frequency of restore cycling is greater than the first frequency of restore cycling.
申请公布号 US7379381(B1) 申请公布日期 2008.05.27
申请号 US20050175057 申请日期 2005.07.05
申请人 T-RAM SEMICONDUCTOR, INC. 发明人 ROY RICHARD;NEMATI FARID
分类号 G11C8/00 主分类号 G11C8/00
代理机构 代理人
主权项
地址