ASSEMBLY TYPE MINI-GARDEN,申请号KR20060111642-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	ASSEMBLY TYPE MINI-GARDEN
摘要
申请公布号	KR100832105(B1)	申请公布日期	2008.05.27
申请号	KR20060111642	申请日期	2006.11.13
申请人		发明人
分类号	A01G9/02;A01G1/08;A01G9/00	主分类号	A01G9/02
代理机构		代理人
主权项
地址

您可能感兴趣的专利

MULTILEVEL FSK MODULATION SYSTEM

COMMUNICATION SYSTEM AND COMMUNICATION CONTROL UNIT

INFORMATION TRANSMISSION SYSTEM FOR ELEVATOR

EQUIPMENT FOR COMMUNICATING ELECTRIC FIELD DATA

BATTERY OPERATED CALLING APPARATUS

FILM PATTERN FORMING METHOD AND APPARATUS THEREOF, CONDUCTIVE FILM WIRING, ELECTRO-OPTICAL DEVICE, ELECTRONIC APPARATUS, AND NONCONTACT TYPE CARD MEDIUM

FLEXIBLE SUBSTRATE AND LIQUID CRYSTAL DISPLAY ELEMENT PROVIDED WITH FLEXIBLE SUBSTRATE

METHOD FOR MANUFACTURING SURFACE-EMITTING SEMICONDUCTOR LASER ELEMENT, THE SURFACE-EMITTING SEMICONDUCTOR LASER ELEMENT AND OPTICAL TRANSMISSION SYSTEM

SEMICONDUCTOR LASER AND METHOD FOR MANUFACTURING THE SAME

PIEZOELECTRIC CONVERSION COMPOSITE MATERIAL AND ITS MANUFACTURING METHOD

THERMOELECTRIC CONVERSION MODULE

FIELD EFFECT TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SOLID-STATE IMAGE PICKUP DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

ELECTRON-BEAM PATTERN INSPECTING APPARATUS AND PATTERN INSPECTING METHOD USING ELECTRON BEAM

MARK MATERIAL FOR INSPECTION OF SEMICONDUCTOR DEVICE AND INSPECTION METHOD USING THE SAME