| 摘要 |
This method for optimizing the performance of a semiconductor detector intended to detect electromagnetic radiation, especially X-rays or gamma rays, equipped with electrodes separately mounted on two opposite surfaces of said detector, namely a cathode and a pixelated anode respectively, involves (i) determining the signal that is representative of the sum of the charges detected by all or some of the anodes; and (ii) using the signal that is representative of said sum of the charges to establish one or more biparametric spectra as a function of this signal so as to determine any charge collection loss if charge sharing occurred on the pixelated anodes and, consequently, performing appropriate processing depending on the type of result desired.
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