发明名称 PROBE UNIT AND ITS MANUFACTURING METHOD
摘要 A probe unit comprises a substrate and a lead formed on the substrate and having a tip part projecting from an edge of the substrate and contacting to an electrode of a sample, and a thick part of which thickness is thicker than the tip part. The probe unit can make continuity with a sample firmly with a proper contact pressure while lowering electrical resistance of leads.
申请公布号 US2008115354(A1) 申请公布日期 2008.05.22
申请号 US20080970704 申请日期 2008.01.08
申请人 YAMAHA CORPORATION 发明人 SUGIURA MASAHIRO;HIYAMA KUNIO;OGINO SUSUMU
分类号 H01S4/00;G01R1/073;G01R3/00;G01R31/02;H05K3/10 主分类号 H01S4/00
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