发明名称 Method and apparatus for providing uniform plasma in a magnetic field enhanced plasma reactor
摘要 A method and apparatus for controlling a magnetic field gradient within a magnetically enhanced plasma reactor. The apparatus comprises a cathode pedestal supporting a wafer within an enclosure, a plurality of electromagnets positioned proximate the enclosure for producing a magnetic field in the enclosure and a magnetic field control element, positioned proximate the electromagnets, for controlling the magnetic field proximate a specific region of the wafer.
申请公布号 US7374636(B2) 申请公布日期 2008.05.20
申请号 US20020205870 申请日期 2002.07.26
申请人 APPLIED MATERIALS, INC. 发明人 HORIOKA KEIJI;YAN CHUN;SHIN TAEHO;LINDLEY ROGER ALAN;HUGHES PANYIN;BURNS DOUGLAS H.;LEE EVANS Y.;PU BRYAN Y.;LI QI;DAHIMENE MAHMOUD
分类号 H01L21/306;C23C16/00;H01J37/32 主分类号 H01L21/306
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