SEMICONDUCTOR MEMORY DEVICE, MEMORY TEST SYSTEM HAVING THE SAME AND METHOD OF TESTING ON-DIE TERMINATION,申请号KR20060081449-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY DEVICE, MEMORY TEST SYSTEM HAVING THE SAME AND METHOD OF TESTING ON-DIE TERMINATION
摘要
申请公布号	KR100829787(B1)	申请公布日期	2008.05.16
申请号	KR20060081449	申请日期	2006.08.28
申请人		发明人
分类号	G06F11/28	主分类号	G06F11/28
代理机构		代理人
主权项
地址

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