发明名称 MASK ETCHING PLASMA REACTOR WITH CATHODE OF UNIFORM ETCHING RATE DISTRIBUTION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a plasma reactor for etching a work such as a rectangular or square mask. <P>SOLUTION: The plasma reactor comprises a vacuum chamber having a ceiling and a sidewall, and a work supporting base including a cathode having a surface for supporting a work in the chamber wherein the surface includes a plurality of individual regions formed of individual materials of different electrical characteristics. The regions can be arranged concentrically to the axis of symmetry of the wafer supporting base. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008112965(A) 申请公布日期 2008.05.15
申请号 JP20070188633 申请日期 2007.07.19
申请人 APPLIED MATERIALS INC 发明人 LEWINGTON RICHARD;GRIMBERGEN MICHAEL N;NGUYEN KHIEM K;BIVENS DARIN;CHANDRACHOOD MADHAVI R;KUMAR AJAY
分类号 H01L21/3065;G03F1/08;H01L21/027 主分类号 H01L21/3065
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