发明名称 |
MASK ETCHING PLASMA REACTOR WITH CATHODE OF UNIFORM ETCHING RATE DISTRIBUTION |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a plasma reactor for etching a work such as a rectangular or square mask. <P>SOLUTION: The plasma reactor comprises a vacuum chamber having a ceiling and a sidewall, and a work supporting base including a cathode having a surface for supporting a work in the chamber wherein the surface includes a plurality of individual regions formed of individual materials of different electrical characteristics. The regions can be arranged concentrically to the axis of symmetry of the wafer supporting base. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
申请公布号 |
JP2008112965(A) |
申请公布日期 |
2008.05.15 |
申请号 |
JP20070188633 |
申请日期 |
2007.07.19 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
LEWINGTON RICHARD;GRIMBERGEN MICHAEL N;NGUYEN KHIEM K;BIVENS DARIN;CHANDRACHOOD MADHAVI R;KUMAR AJAY |
分类号 |
H01L21/3065;G03F1/08;H01L21/027 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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