发明名称 |
METHOD FOR CHARACTERIZING INTEGRATED CIRCUITS FOR IDENTIFICATION OR SECURITY PURPOSES |
摘要 |
A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequent integrated circuit of unknown background.
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申请公布号 |
US2008111561(A1) |
申请公布日期 |
2008.05.15 |
申请号 |
US20060559361 |
申请日期 |
2006.11.13 |
申请人 |
KORMANYOS BRIAN K |
发明人 |
KORMANYOS BRIAN K. |
分类号 |
G01N22/00;G01R31/26;G06K9/00 |
主分类号 |
G01N22/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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