DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

摘要

A diagnostic device providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic device (1) has a symbol inserting section (3) which is composed of an active element symbol inserting sub-section (5) and a passive element symbol inserting sub-section (7), an occurrence probability imparting section (9), and equivalent occurrence probability imparting section (11), and a switching section (13). A per-test X failure diagnosis flow by the diagnostic device (1) is structured by a failure information collection stage and a diagnosis conclusion stage. The layout of a deep submicron LSI circuit frequently needs multilayer interconnection and information on vias to be widely used is used. Therefore, the passive element symbol inserting sub-section (7) can indicate defective portions at the via level, and the diagnosis resolution is significantly improved. The occurrence probability imparting section (9) uses a new diagnosis value and takes the occurrence probability of a logical combination of possible failures which may occur into consideration. As a result, the actual operation of a deep submicron LSI circuit is well reflected, and is useful for improvement of the diagnosis resolution.