发明名称 |
Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof |
摘要 |
In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.
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申请公布号 |
US2008112524(A1) |
申请公布日期 |
2008.05.15 |
申请号 |
US20070822216 |
申请日期 |
2007.07.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
PAEK SOO-JIN;LEE JAE-WOOK;CHO HO-KEUN |
分类号 |
H03D3/24 |
主分类号 |
H03D3/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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