发明名称 Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof
摘要 In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.
申请公布号 US2008112524(A1) 申请公布日期 2008.05.15
申请号 US20070822216 申请日期 2007.07.03
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 PAEK SOO-JIN;LEE JAE-WOOK;CHO HO-KEUN
分类号 H03D3/24 主分类号 H03D3/24
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