发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a power device with which a self-alignment forming process of a channel can be simplified and cost can be reduced. SOLUTION: The manufacturing method of a semiconductor device using SiC is provided with a process for forming a first ion injection mask 4 consisting of photoresist on an n<SP>+</SP>type SiC substrate 1 being a SiC base and on a surface of an n<SP>-</SP>type SiC epitaxial film 2, a process for injecting ions in a surface layer part of the SiC base through the first ion injection mask 4 and forming a p type base region 5, a process for forming a photoresist film 6 on the SiC base and a surface of the first ion injection mask 4 and heating it, a process for developing the photoresist film 6 and leaving a second ion injection mask 7 consisting of a bridge layer on a side wall of the first ion injection mask 4 and a process for injecting the ions on a surface layer part of the p type base region 5 through the first ion injection mask 4 and the second ion injection mask 7 and forming an n<SP>+</SP>type source region 8. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008108869(A) 申请公布日期 2008.05.08
申请号 JP20060289618 申请日期 2006.10.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 WATANABE HIROSHI;SUMIYA HIROAKI
分类号 H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/336
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