发明名称 DISPLAY PANEL TESTING APPARATUS AND TESTING METHOD
摘要 <p>An apparatus for testing a display panel (1) in which display elements (E11-Emn) are connected in a matrix at respective ones of the intersections of a plurality of anode lines (A1-Am) and a plurality of cathode lines (K1-Kn). A voltage from a test power supply (E1) is applied to the cathode line connected to a display element to be tested, while a voltage (ground potential) from a determination anode power supply, which is lower in voltage value than the test power supply (E1), is applied to the anode line connected to the display element to be tested. In the meantime, the voltage of a non-determination power supply (E2), which has the same voltage value as the test power supply (E1), is applied to each of the cathode and anode lines that are not connected to the display element to be tested. In the structure described heretofore, the value of a current flowing from the test power supply (E1) is determined by a current determining means (2), whereby the potentially defective state of the display element to be tested can be examined with precision without receiving the affection of a "sneak current" via an defective element that is not the display element to be tested.</p>
申请公布号 WO2008050380(A1) 申请公布日期 2008.05.02
申请号 WO2006JP321037 申请日期 2006.10.23
申请人 PIONEER CORPORATION;TOHOKU PIONEER CORPORATION;TOGASHI, MASATO;MORIYA, KEISUKE 发明人 TOGASHI, MASATO;MORIYA, KEISUKE
分类号 G09F9/00;H01L51/50;G01R31/00;H05B33/12 主分类号 G09F9/00
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