发明名称 METHOD FOR FABRICATING A SEMICONDUCTOR STRUCTURE
摘要 A method for fabricating a semiconductor including defining a first component region and a second component region in a semiconductor body is provided. A first epitaxial layer is formed through the first component region. A second epitaxial layer is formed over the first epitaxial layer, including configuring the physical dimensions of a first active zone of the first component region independent of a second active zone of the second component region via the first epitaxial layer and the second epitaxial layer. In one embodiment, the first component is a radio-frequency transistor and the second component is a varactor.
申请公布号 US2008102593(A1) 申请公布日期 2008.05.01
申请号 US20060553704 申请日期 2006.10.27
申请人 INFINEON TECHNOLOGIES AG 发明人 MEISTER THOMAS;SCHAFER HERBERT;BOCK JOSEF;LACHNER RUDOLF
分类号 H01L21/20;H01L21/8222;H01L27/082;H01L27/102;H01L29/70;H01L31/11 主分类号 H01L21/20
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