发明名称 Phase Change Memory, Phase Change Memory Assembly, Phase Change Memory Cell, 2D Phase Change Memory Cell Array, 3D Phase Change Memory Cell Array and Electronic Component
摘要 A phase change memory having a memory material layer consisting of a phase change material, and a first and second electrical contact which are located at a distance from one another and via which a switching zone of the memory material layer can be traversed by a current signal, wherein the current signal can be used to induce a reversible phase change between a crystalline phase and an amorphous phase and thus a change in resistance of the phase change material in the switching zone. The invention also relates to a phase change memory assembly, a phase change memory cell, a 2D phase change memory cell array, a 3D phase change memory cell array and an electronic component.
申请公布号 US2008101109(A1) 申请公布日期 2008.05.01
申请号 US20040576760 申请日期 2004.10.19
申请人 HARING-BOLIVAR PETER;BECHEVET BERNARD;SOUSA VERONIQUE;KIM DAE-HWANG;KURZ HEINRICH;MERGET FLORIAN 发明人 HARING-BOLIVAR PETER;BECHEVET BERNARD;SOUSA VERONIQUE;KIM DAE-HWANG;KURZ HEINRICH;MERGET FLORIAN
分类号 G11C11/00;H01L27/24;H01L45/00 主分类号 G11C11/00
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