发明名称 MANUFACTURING METHOD OF RETICLE WITH ENHANCED RESOLVING POWER IN ISOLATED PATTERN AND RETICLE STRUCTURE THEREBY
摘要 <p>A reticle manufacturing method and a reticle structure are provided to obtain the enhanced resolution power of an isolated pattern without using a high-grade mask, by patterning an isolated space region with a layer having low transmittance of 10 to 20% for a light. A reticle manufacturing method for enhancing resolving power in patterning an isolated space comprises the steps of: forming a low transmittance layer and a light shielding layer(30) on a quartz substrate(10), wherein the low transmittance layer comprises the first low transmittance layer(21) with a large pattern and the second low transmittance layer(22) with a narrow pattern; patterning the light shielding layer; patterning the low transmittance layer; and selectively removing the light shielding layer from an isolated space region.</p>
申请公布号 KR100826765(B1) 申请公布日期 2008.04.30
申请号 KR20060125103 申请日期 2006.12.08
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 DO, MUN HOE
分类号 H01L21/027 主分类号 H01L21/027
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