发明名称 Method of manufacturing a closed cell trench MOSFET
摘要 Embodiments of the present invention provide an improved closed cell trench metal-oxide-semiconductor field effect transistor (TMOSFET). The closed cell TMOSFET comprises a drain, a body region disposed above the drain region, a gate region disposed in the body region, a gate insulator region, a plurality of source regions disposed at the surface of the body region proximate to the periphery of the gate insulator region. A first portion of the gate region and the gate oxide region are formed as parallel elongated structures. A second portion of the gate region and the oxide region are formed as normal-to-parallel elongated structures. A portion of the gate and drain overlap region are selectively blocked by the body region, resulting in lower overall gate to drain capacitance.
申请公布号 US7361558(B2) 申请公布日期 2008.04.22
申请号 US20050040129 申请日期 2005.01.20
申请人 VISHAY-SILICONIX 发明人 PATTANAYAK DEVA N.;XU ROBERT
分类号 H01L21/336;H01L;H01L21/8234;H01L29/10;H01L29/76;H01L29/78;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/336
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