发明名称 POLYMER, RESIST PROTECTIVE COATING MATERIAL AND PATTERNING PROCESS
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist protective coating material useful for liquid immersion lithography having excellent process applicability, which is capable of conducting good liquid immersion lithography and also capable of removing at the same time with the development of photo-resist layers and also to provide a resist pattering process using the material, and further to provide a polymer compound useful as a resist protective material. <P>SOLUTION: The polymer compound is composed of a repeating unit shown by the general formula (1) (wherein R<SP>1</SP>and R<SP>2</SP>are, same or differently, a hydrogen atom or a straight chained, branched or cyclic alkyl group of 1-12C, and they may form a ring together with a carbon atom to which they are bonded and R<SP>30</SP>is a hydrogen atom or a methyl group). In the patterning process using the resist protective film material, the resist protective film formed on a resist film is not soluble in water and soluble in an aqueous alkaline solution (an alkaline developing fluid) and is immiscible with a resist film, and thus good liquid immersion lithography can be achieved and the development of a resist film and removal of the protective film can be conducted at the same time with the alkaline development. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008081716(A) 申请公布日期 2008.04.10
申请号 JP20070012135 申请日期 2007.01.23
申请人 SHIN ETSU CHEM CO LTD 发明人 HATAKEYAMA JUN;HASEGAWA KOJI;HARADA YUJI
分类号 C08F20/28;C08F232/08;G03F7/004;G03F7/11;G03F7/38 主分类号 C08F20/28
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