| 摘要 |
PROBLEM TO BE SOLVED: To provide a piezoelectric oscillator capable of performing the characteristic measurement inspection of a piezoelectric oscillation element easily and reliably, and improving productivity and workability. SOLUTION: A support substrate has the area of a main surface wider than that of an outer bottom surface in the piezoelectric oscillator, and is arranged under the outer bottom surface of the piezoelectric oscillator. An electrode terminal for substrate connection formed on the outer bottom surface in the piezoelectric oscillator is connected onto an oscillator mount pad formed on one main surface of the support substrate electrically and mechanically. When the piezoelectric oscillator is arranged on the support substrate, an electrode terminal for monitoring, which is connected to the piezoelectric oscillation element via a vessel electrically, is provided in the region on one main surface of the support substrate outside the piezoelectric oscillator arrangement region. COPYRIGHT: (C)2008,JPO&INPIT
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