发明名称 PROBE FOR MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide a probe for measurement capable of easily and certainly replacing the tip of an oxidized probe with a new one. SOLUTION: The probe for measurement disposed in a predetermined measuring device has a probe body 3 for measurement constituted by interconnecting a plurality of probe sections 30 having an acute tip 30A in a row. A storage section 32 for storing the tip 30A of the second probe section 30 is disposed in the rear end 30B of the first probe section 30. In a state where the tip 30A of the second probe section 30 is stored in the storage section 32 of the first probe section 30, the rear end 30B of the first probe section 30 is connected and fixed to the tip 30A of the second probe section 30 by a predetermined fixing means allowing electric conduction between the first probe section 30 and the second probe section 30, and the connection fixed section between the first probe section 30 and the second probe section 30 is separable. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008082889(A) 申请公布日期 2008.04.10
申请号 JP20060263319 申请日期 2006.09.27
申请人 FUNAI ELECTRIC CO LTD 发明人 KIKUCHI YASUTSUNE
分类号 G01R1/067 主分类号 G01R1/067
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