发明名称 TEMPERATURE INFORMATION OUTPUT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a circuit updating temperature information in accordance with a refresh period in a semiconductor element. SOLUTION: The device is provided with a temperature information output means measuring internal temperature of the semiconductor element, generates a temperature information signal having measured temperature information, and updating the temperature information signal in accordance with the refresh period. The device is also provided with a temperature information output means in which internal temperature of the semiconductor element is measured and a plurality of flag signals of which the logical levels are changed in accordance with a temperature information code and measured temperature are generated and the temperature information code is updated in response to a refresh instruction signal in a normal mode or a self-refresh oscillation signal in a self-refresh mode, a code storing means storing the updated temperature information code, a memory control means reading out stored data and varying a period of the refresh instruction signal, and a self-refresh oscillation means varying a period of the self-refresh oscillation signal in accordance with the plurality of flag signals. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008084514(A) 申请公布日期 2008.04.10
申请号 JP20070176801 申请日期 2007.07.04
申请人 HYNIX SEMICONDUCTOR INC 发明人 TEI CHINSHAKU;PARK KEE-TEOK
分类号 G11C11/406;G01K7/01;G11C11/401;G11C11/403;H01L21/8242;H01L27/108 主分类号 G11C11/406
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