发明名称 Method and apparatus for designing fine pattern
摘要 Provided are a method and apparatus for designing a fine pattern that can be entirely transferred onto an object. The method includes reading the original data of a fine pattern for exposure. The fine pattern is divided into a first pattern not requiring revision and a second pattern requiring revision. The fine pattern is revised by forming an auxiliary pattern maintaining a first distance D1 from the second pattern. A fine pattern to be transferred onto a target object is estimated by running an emulation program including a first auxiliary pattern and a second auxiliary pattern. The estimated fine pattern is compared to the original data of the fine pattern for exposure, and the revised fine pattern is designated as a final fine pattern if there is no difference between the estimated fine pattern and the original data of the fine pattern for exposure.
申请公布号 US2008082954(A1) 申请公布日期 2008.04.03
申请号 US20060590399 申请日期 2006.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN JAE-PIL;KIM YOUNG-ILE;YOO MOON-HYUN;LEE JONG-BAE
分类号 G06F17/50;G03F1/00;G03F1/68;H01L21/027 主分类号 G06F17/50
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