发明名称 CIRCUIT PATTERN INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent erroneous determination of disconnection or short circuit of a circuit pattern accompanying steep variation of a detected signal due to non-sticking area to an inspection substrate or variation of the capacity coupling by a recessed part formed in a stage mounting surface for mounting the inspection substrate in a circuit pattern inspection device. SOLUTION: The circuit pattern inspection device performs electric capacity coupling of a sensor electrode for inspection to the circuit pattern in a non-contact manner, and determines goodness/badness of a plurality of circuit patterns by the detected signal. Grooves and holes formed in the stage mounting surface for mounting the inspection substrate having the circuit patterns are arranged so as to provide the same capacity coupling to each circuit pattern. Alternatively, by rounding or tapering an edge parts of the grooves and holes, the steep variation of the detected signal received for adjacent circuit patterns is moderated, and the variation of the threshold calculated based on the detected signal used for goodness/badness determination is corrected so as to follow the variation of the detected signal to prevent the incorrect determination. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076187(A) 申请公布日期 2008.04.03
申请号 JP20060254800 申请日期 2006.09.20
申请人 OHT INC 发明人 HAMORI HIROSHI;YAMAOKA SHUJI;ISHIOKA SEIGO
分类号 G01R31/02;G02F1/13;H05K3/00 主分类号 G01R31/02
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