| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an internal potential monitoring device for a semiconductor memory device which easily monitors the internal potential ofthea semiconductor memory device after package and also easily monitors the internal potential small in swing width, and to provde monitoring method therefor. <P>SOLUTION: The device is provided with: a converting means for converting the internal potential to be monitored into a digital signal based on reference voltage applied from the outside in response to a test mode signal; and an output means for transmitting the digital signal to a scheduled arbitrary pad in response to the test mode signal. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
