| 摘要 |
PROBLEM TO BE SOLVED: To provide a jig for fixing a sample in microscope observation, in particular, a fixing jig for the microscope observation for observing precisely cross-sectional structure of the sample with a cross-sectional face cut out by a cross-sectional face cut-out device. SOLUTION: This fixing jig is used for the microscope observation observing the sample cross-sectional face by a microscope, without removing the sample the cross-sectional face of which is cut-out by the cross-sectional face cut-out device, fixed onto a sample holder for the cross-sectional face cut-out device, from the sample holder for the cross-sectional face cut-out device. The fixing jig for the microscope observation is constituted to be planar, and is also constituted to insert at least one part of a fixing part of the cross-sectional face cutting-out sample holder to the sectional face cut-out device, and to have a hole for allowing rotation while keeping the cross-sectional cut-out face of the sample fixed onto the cross-sectional face cutting-out sample holder horizontal with respect to the fixing jig for the microscope observation, under the condition that the cross-sectional face cutting-out sample holder is inserted. COPYRIGHT: (C)2008,JPO&INPIT
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