发明名称 INSPECTION SYSTEM AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection system and an inspection method which can detect the three-dimensional shape of cream solder. SOLUTION: A lighting apparatus 5 irradiates a substrate on which the cream solder is applied with a plurality of infrared rays having different intensity. A photographing apparatus 6 photographs the substrate irradiated with the infrared rays for each intensity of the infrared rays, thereby allowing to acquire a plurality of images having different intensity of the infrared rays irradiated on the substrate and detect the three-dimensional shape of the cream solder on the basis of the images. In accordance with the internal condition of the cream solder, a substrate is carried out, or a warning is issued, thereby preventing a substrate on which defective cream solder is applied from being carried out. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076151(A) 申请公布日期 2008.04.03
申请号 JP20060254175 申请日期 2006.09.20
申请人 I-PULSE CO LTD 发明人 TSUNODA YOSHIHISA;NAKAJIMA TSUTOMU
分类号 G01B11/24;B23K1/00;B23K101/42;G01N21/956;H05K3/34 主分类号 G01B11/24
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